GS 二氧化硅基底单层氮化硼薄膜

货号:100175 编号:XF059

CAS号:7440-44-0 规格:1盒 4片 8mmx8mm

包装:1盒 保质期:0天

保存条件:常温干燥避光密封

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包装:每盒4片 面积:8mm*8mm单片  基底:二氧化硅基底

Single Layer CVD hexagonal Boron Nitride Film on 285 nm SiO2/Si substrates (p-doped), 8 mm x 8 mm: 4 pack


Properties of BN film


  • 95% coverage

  • High Crystalline Quality

  • The Raman spectrum should peak at ~1369cm-1

    The Raman Signal of BN on SiO2/Si is very weak. To characterize h-BN on SiO2/Si using Raman spectroscopy, you need to use a blue or high power laser and the signal may not be detectable on certain commercial systems. For more information regarding Raman spectroscopy and characterization of h-BN on SiO2/Si, refer to the following paper: Hunting for Monolayer Boron Nitride: Optical and Raman Signatures .

    The h-BN film is grown via CVD onto copper foil, then transferred to the SiO2/Si substrate. To see characterizations of the film before transfer, see our related product, h-BN on Copper Foil.


    Applications:


    BN on SiO2/Si wafers are ideal for creating graphene/BN interfaces, allowing the graphene to be precisely gated, increasing mobility, and reducing scattering. h-BN is appealing as a substrate for graphene-based electronics because its surface is atomically smooth, it is free of dangling bonds, and has an analogous structure to graphene. Using our h-BN on SiO2/Si wafers in conjunction with graphene, we encourage you to explore graphene heterostructures for transistor applications.




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